Schema documentation for component ThicknessCharacteristicMeasurementType

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Annotations

Attributes

Diagrams

Source

Used by

Complex Type ThicknessCharacteristicMeasurementType

Annotations

The ThicknessCharacteristicMeasurementType defines the results of a measured thickness characteristic evaluation.

Diagram

Type

extension of LinearCharacteristicMeasurementBaseType

Type hierarchy

CharacteristicBaseType
- CharacteristicMeasurementBaseType
  - DimensionalCharacteristicMeasurementBaseType
    - LinearCharacteristicMeasurementBaseType
      - ThicknessCharacteristicMeasurementType

Used by

Element

ThicknessCharacteristicMeasurement

Children

ActualComponentId, Attributes, CharacteristicItemId, Description, FeatureMeasurementIds, ManufacturingProcessId, MaxValue, MeasurementDeviceIds, MinValue, NonConformanceDesignator, NotedEventIds, Status, SubstituteFeatureAlgorithm, TimeStamp, Value

Attributes

QName

Type

Use

Annotation

QIFIdType

required

The id attribute is the QIF id of the characteristic, used for referencing.

Source

<xs:complexType name="ThicknessCharacteristicMeasurementType">
  <xs:annotation>
    <xs:documentation>The ThicknessCharacteristicMeasurementType defines the results of a measured thickness characteristic evaluation.</xs:documentation>
  </xs:annotation>
  <xs:complexContent>
    <xs:extension base="LinearCharacteristicMeasurementBaseType"/>
  </xs:complexContent>
</xs:complexType>

Schema location

file:////Q:/kramer/qif3.0/model/QIFforHTMLxsd/QIFLibrary/Characteristics.xsd