Schema documentation for component SurfaceProfileCharacteristicMeasurementType

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Annotations

Attributes

Diagrams

Source

Used by

Complex Type SurfaceProfileCharacteristicMeasurementType

Annotations

The SurfaceProfileCharacteristicMeasurementType defines the results of a measured profile of a surface characteristic evaluation.

Diagram

Type

extension of ProfileCharacteristicMeasurementBaseType

Type hierarchy

CharacteristicBaseType
- CharacteristicMeasurementBaseType
  - GeometricCharacteristicMeasurementBaseType
    - ProfileCharacteristicMeasurementBaseType
      - SurfaceProfileCharacteristicMeasurementType

Used by

Element

SurfaceProfileCharacteristicMeasurement

Children

ActualComponentId, Attributes, CharacteristicItemId, DRFTransformActualId, DatumsOk, Description, FeatureMeasurementIds, FourthCompositeSegmentProfileMeasurement, ManufacturingProcessId, MaxValue, MeasurementDeviceIds, MinValue, NonConformanceDesignator, NotedEventIds, PointDeviations, SecondCompositeSegmentProfileMeasurement, Status, SubstituteFeatureAlgorithm, ThirdCompositeSegmentProfileMeasurement, TimeStamp, Value, WorstNegativeDeviation, WorstPositiveDeviation

Attributes

QName

Type

Use

Annotation

QIFIdType

required

The id attribute is the QIF id of the characteristic, used for referencing.

Source

<xs:complexType name="SurfaceProfileCharacteristicMeasurementType">
  <xs:annotation>
    <xs:documentation>The SurfaceProfileCharacteristicMeasurementType defines the results of a measured profile of a surface characteristic evaluation.</xs:documentation>
  </xs:annotation>
  <xs:complexContent>
    <xs:extension base="ProfileCharacteristicMeasurementBaseType"/>
  </xs:complexContent>
</xs:complexType>

Schema location

file:////Q:/kramer/qif3.0/model/QIFforHTMLxsd/QIFLibrary/Characteristics.xsd